Perfect X-ray focusing via fitting corrective glasses to aberrated optics

نویسندگان

  • Frank Seiboth
  • Andreas Schropp
  • Maria Scholz
  • Felix Wittwer
  • Christian Rödel
  • Martin Wünsche
  • Tobias Ullsperger
  • Stefan Nolte
  • Jussi Rahomäki
  • Karolis Parfeniukas
  • Stylianos Giakoumidis
  • Ulrich Vogt
  • Ulrich Wagner
  • Christoph Rau
  • Ulrike Boesenberg
  • Jan Garrevoet
  • Gerald Falkenberg
  • Eric C Galtier
  • Hae Ja Lee
  • Bob Nagler
  • Christian G Schroer
چکیده

Due to their short wavelength, X-rays can in principle be focused down to a few nanometres and below. At the same time, it is this short wavelength that puts stringent requirements on X-ray optics and their metrology. Both are limited by today's technology. In this work, we present accurate at wavelength measurements of residual aberrations of a refractive X-ray lens using ptychography to manufacture a corrective phase plate. Together with the fitted phase plate the optics shows diffraction-limited performance, generating a nearly Gaussian beam profile with a Strehl ratio above 0.8. This scheme can be applied to any other focusing optics, thus solving the X-ray optical problem at synchrotron radiation sources and X-ray free-electron lasers.

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عنوان ژورنال:

دوره 8  شماره 

صفحات  -

تاریخ انتشار 2017